Article
  • Fabrication Process of a Nano-precision Polydimethylsiloxane Replica using Vacuum Pressure-Difference Technique
  • Park SH, Lim TW, Yang DY, Kong HJ, Lee KS
  • 진공 압력차이법에 의한 나노 정밀도를 가지는 폴리디메틸실록산 형상복제
  • 박상후, 임태우, 양동열, 공홍진, 이광섭
References
  • 1. Chou SY, Keimel C, Gu J, Nature, 417, 835 (2002)
  •  
  • 2. Kim YS, Suh KY, Lee HH, Appl. Phys. Lett., 79, 2285 (2001)
  •  
  • 3. Xia Y, Whitesides GM, Angew. Chem.-Int. Edit., 37, 550 (1998)
  •  
  • 4. Odom TW, Love JC, Wolfe DB, Paul KE, Whitesides GM, Langmuir, 18(13), 5314 (2002)
  •  
  • 5. Zaumseil J, Meitl MA, Hsu JWP, Acharya BR, Baldwin KW, Loo YL, Rogers JA, Nano Lett., 3, 1223 (2003)
  •  
  • 6. Maruo S, Nakamura O, Kawata S, Opt. Lett., 22, 132 (1997)
  •  
  • 7. Maruo S, Kawata S, J. Microelectromechanical Systems, 7, 411 (1998)
  •  
  • 8. Sun HB, Takada K, Kawata S, Appl. Phys. Lett., 79, 3173 (2001)
  •  
  • 9. Galajda P, Ormos P, Appl. Phys. Lett., 78, 249 (2001)
  •  
  • 10. Kawata S, Sun HB, Tanaka T, Takada K, Nature, 412, 697 (2001)
  •  
  • 11. Serbin J, Egbert A, Ostendorf A, Chichkov BN, Houbertz R, Domann G, Schulz J, Cronauer C, Frohlich L, Popall M, Opt. Lett., 28, 301 (2003)
  •  
  • 12. Sun HB, Matsuo S, Misawa H, Appl. Phys. Lett., 74, 786 (1999)
  •  
  • 13. Sun HB, Maeda M, Takada K, Chon JWM, Gu M, Kawata S, Appl. Phys. Lett., 83, 819 (2003)
  •  
  • 14. Sun HB, Xu Y, Juodkazism S, Sun K, Watanabe M, Matsuo S, Misawa H, Nishii J, Opt. Lett., 26, 325 (2001)
  •  
  • 15. Kaneko K, Sun HB, Duan XM, Kawata S, Appl. Phys. Lett., 83, 2091 (2003)
  •  
  • 16. Tanaka T, Sun HB, Kawata S, Appl. Phys. Lett., 80, 312 (2002)
  •  
  • 17. Sun HB, Takada K, Kim MS, Lee KS, Kawata S, Appl. Phys. Lett., 83, 1104 (2003)
  •  
  • 18. Yang HK, Lee KSunpublished results
  •  
  • 19. Jacobs PFStereolithography and other RP&M Technologies, ASME Press (1996)
  •  
  • Polymer(Korea) 폴리머
  • Frequency : Bimonthly(odd)
    ISSN 0379-153X(Print)
    ISSN 2234-8077(Online)
    Abbr. Polym. Korea
  • 2023 Impact Factor : 0.4
  • Indexed in SCIE

This Article

  • 2004; 28(4): 305-313

    Published online Jul 25, 2004

  • 10.7317/pk.
  • Received on Mar 12, 2004
  • Revised on Nov 30, -0001
  • Accepted on Jun 30, 2004

Correspondence to

  • E-mail: